Practical Framework for Obtaining Accurate Data with XPS
¥62 ,500
This technical book provides a comprehensive overview of X-ray photoelectron spectroscopy (XPS), covering its fundamental principles, theoretical foundations for measurement and analysis, advancements in XPS technology, and a Q&A section addressing common queries in surface analysis.
This is a request, not an immediate purchase. Your card is authorized but not charged. Delivery takes about one week. We capture payment when the English PDF is ready.
説明
This is a request, not an immediate purchase. Delivery takes about one week. Your card is authorized but not charged until the English PDF is ready.
Product ID: 1180
Publisher: Science & Technology
Publication Date: 2026-09-25
English Summary
This technical book provides a comprehensive overview of X-ray photoelectron spectroscopy (XPS), covering its fundamental principles, theoretical foundations for measurement and analysis, advancements in XPS technology, and a Q&A section addressing common queries in surface analysis.
Contents / Coverage
- Chapter 1: Fundamentals and Principles for Utilizing X-ray Photoelectron Spectroscopy
- Chapter 2: Theoretical Foundations of XPS Measurement and Analysis and Approaches for Improving Accuracy
- Chapter 3: Advances in XPS Measurement and Analysis Techniques
- Chapter 4: Q&A on Surface Analysis Methods: XPS Edition
Why This May Matter Internationally
XPS is widely used in various fields such as materials science, chemistry, and nanotechnology. This book serves as a valuable resource for researchers and professionals looking to enhance their understanding and application of XPS techniques.
Keywords: XPS,X-ray photoelectron spectroscopy,surface analysis,technical book,Science & Technology