Comprehensive Failure Analysis Techniques for LSI and Their Practical Applications
¥25 ,000
English catalog entry for a Japanese market intelligence report by Nihon Techno Center. This page is an original catalog description, not a full translation of the Japanese edition.
This is a request, not an immediate purchase. Your card is authorized but not charged. Delivery takes about one week. We capture payment when the English PDF is ready.
Description
This is a request, not an immediate purchase. Delivery takes about one week. Your card is authorized but not charged until the English PDF is ready.
Product ID: 1169
Publisher: Nihon Techno Center
Publication Date: Not stated
English Summary
English catalog entry for a Japanese market intelligence report by Nihon Techno Center. This page is an original catalog description, not a full translation of the Japanese edition.
Why This May Matter Internationally
This technical book provides insights into failure analysis techniques specifically for LSI (Large Scale Integration) technology, which is crucial for professionals in the semiconductor industry worldwide. Understanding these methodologies can enhance product reliability and performance in various applications.
Keywords: Japan,technical book,Nihon Techno Center